CM-4 mini probe station

Mini size, modular design, for I-V/C-V, PIV test, optoelectronic test, up to 6 inch wafer, applicable to glove box

CS-4 small probe station

Small size, modular design, light weight, up to 6 inch wafer, for I-V/C-V, PIV, optoelectronic tests, applicable to glove box

CL-6 middle-sized probe station

Modular design, precise screw drive structure, up to 8 inch wafer, upgradable for RF test, high current test and laser repair applications.

CH-8-D

CINDBEST CH-8-D 雙面點針探針臺可用于晶圓和PCB板測試，用于需要正面和背面同時扎針，以實現各種光/電性能測試需求的測試設備。該定制探針臺具有優良的機械系統，穩定的結構，符合人體工程學，以及多項升級功能�？蓮V泛應用于集成電路、Wafer ， LED、LCD、太陽能電池等行業的制造和研究領域。

CH-8 large-sized comprehensive probe station

Modular design, seamless upgrade, up to 12 inch wafer. Quick and fine-tuning lift function for chuck stage. Capable for Wafer test, PCB/IC test, RF test, high voltage and current tes

CH-12 large-sized comprehensive probe station

Modular design, seamless upgrade, up to 12 inch wafer, high precise screw drive structure, linear movement, quick and fine-tuning lift function for chuck stage, capable for Wafer test, PCB/IC test,

CT-6 non-vacuum high and low temperature probe station

Sealed chamber, optimized design with low liquid nitrogen consumption. No frost, high precise screw drive structure, linear movement.

CGO-Variable temperature vacuum probe station

High vacuum chamber, 77K-673K(liquid nitrogen)/4.5K-673K(liquid helium) temperature range, Compatible with IV/CV/RF test, radiation isolating design.

CSA-8 semi-automatic alignment probe station

Automatic alignment test on wafer, simple and fast operation, high resolution and MAP display function.

0.5μm micropositioner

0.5μm resolution, Swiss made precise screw, effective and precise for I-V/C-V /RF submicron probing test, highly rigid structure, spring loaded X-Y-Z, stable and backlash free